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URL : https://hal.archives-ouvertes.fr/hal-00112943

J. Peng, V. Ji, J. M. Zhang, and &. , Seiler Residual stresses gradient determination in Cu thin films Accepted by, Materials Science Forum, 2006.

J. Peng, V. Ji, W. Seiler, A. Levesque, A. Bouteville et al., Braham GIXRD residual stress analysis on CVD Tantalum thin films ATEM'03, pp.10-12, 2003.

J. Peng, V. Ji, and &. , Seiler Surface roughness effect on pseudo-GIXRD stress analysis ICRS7 14-17 Juin, 2004.

J. Peng, V. Ji, J. M. Zhang, and &. , Seiler Residual stresses gradient determination in Cu thin films ECRS7 13-15, 2006.