Développement et mise en oeuvre d'une méthode de mesure de champs de déformation à l'échelle micrométrique

Abstract : This work deals with the development of a full-field measurement method of plane strain at the micrometric scale. The kinematic measurement is done thanks to the so called « grid method » that analyzes the deformation of a periodic pattern deposited onto the surface to study. To produce gratings, the direct interferential photolithography is used. To observe and digitize these gratings, the choice has been to use a white-light interferometric microscope which allows to get the 3D topography of the surface of interest. A noise study has been carried out in order to optimize the making of gratings regarding their mechanical application. Moreover, the application of rigid body motions has pointed a spatial correlation of the noise that cannot be ignored. Thus, and by paying a particular attention to the experimental realization of the mechanical tests, the strain resolution obtained is from 1 to 2×10−3 for a spatial resolution about 20 μm. A first application concerning the study of elasto-plastic strains of a ferritic steel coupon has permitted to validate the current approach, to fit it to the study of larger regions of interest and to underline its advantages but also its limitations.
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Submitted on : Thursday, December 20, 2007 - 8:00:00 AM
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Raphaël Moulart. Développement et mise en oeuvre d'une méthode de mesure de champs de déformation à l'échelle micrométrique. Sciences de l'ingénieur [physics]. Arts et Métiers ParisTech, 2007. Français. ⟨NNT : 2007ENAM0031⟩. ⟨pastel-00003212⟩

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