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Analyse expérimentale et numérique de la distribution des contraintes résiduelles induites par choc-laser dans les alliages d'aluminium.

Abstract : The objective of this study is to analyze the distribution of residual stresses induced by laser shock peening (LSP) in 2 aluminums alloys (6056-T4 and 2050-T8) by the X-ray diffraction (XRD) and finite element numerical modeling with a particular attention to the very surface of material. In order to study the distribution of residual stresses (RS) in the very near layer (Iess than 10iJm), two analysis methods with pseudo-grazing incidence X-ray diffraction (GIXRD): sin24J* method and multi-reflections have been applied and adapted. These two methods have been tested successfully and allow us for the first time to estimate the mechanical state distribution near the very surface after LSP. The numerical simulation of mechanical state induced by LSP on 3 dimensions (3D) has been developed during this study. The utilization of valid charge P=f(t) and of limit conditions set up (infinite element on the edge of sol id) permit us to estimate the strain and RS induced by one or several laser impacts. Several improvements have been implemented on the model, like the consideration of distinct behavior for the very layers and the core of material. The model has been carried out on different experimental conditions (percentage of overlap, impact diameter and variable pressure) and has been confronted successfully to the experiment.
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https://pastel.archives-ouvertes.fr/pastel-00005901
Contributor : Ecole Arts Et Métiers Paristech <>
Submitted on : Thursday, June 17, 2010 - 8:00:00 AM
Last modification on : Friday, July 17, 2020 - 2:54:12 PM
Long-term archiving on: : Monday, September 20, 2010 - 5:11:19 PM

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  • HAL Id : pastel-00005901, version 1

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Hongbin Song. Analyse expérimentale et numérique de la distribution des contraintes résiduelles induites par choc-laser dans les alliages d'aluminium.. Sciences de l'ingénieur [physics]. Arts et Métiers ParisTech, 2010. Français. ⟨NNT : 2010ENAM0002⟩. ⟨pastel-00005901⟩

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