on détermine les erreurs des paramètres S du DST en fonction des erreurs ?a, ?b, ?d, ?c, ?e, ?f et ?g. En supposant que les déviations des paramètres S ij réels de DST à mesurer ne sont pas affectées par la variation des paramètres m ij bruts, pp.0-42 ,
« analyseur de réseau en micro ondes » Techniques de l'ingénieur, Déc, 2006. ,
«Achieving Greater On-wafer S-parameters Accuracy with the LRM Calibration Techniques, » 34th, ARFTG Conf. Digest, pp.61-66, 1989. ,
« Specifying calibration Standards for the HP 8510 Network Analyzer, 1988. ,
S : « Conception d'un système de Caractérisation Fonctionnelle d'Amplificateur de Puissance en présence de Signaux Modulés à l ,
Fréquence 1-18GHz, 2005. ,
« An SOLR calibration for accurate measurement of orthogonal onwafer DUTs », Microwave Symposium Digest, IEEE MTT-S International, vol.33, issue.s, pp.8-13, 1997. ,
Open and short circuits in coplanar MMIC's, IEEE Transactions on Microwave Theory and Techniques, vol.41, issue.9, pp.1534-1537, 1993. ,
DOI : 10.1109/22.245673
et réalisation d'un analyseur de réseau six portes dans la bande de fréquence 1-18GHz, 1991. ,
« Verification of the wafer-level LRM+ calibration technique for GaAsapplications up to 110 GHz, » ARFTG Microwave Measurements Conference-Spring, 65th, pp.15-19, 2005. ,
« Network Analyzer Error Models and Calibration Methods, »54th ARFTG Conference short notes, 2000. ,
« LRM and LRRM Calibration with automatic determination of load inductance » Cascade Microtech Application note, 1995. ,
The Six-Port Reflectometer: An Alternative Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, vol.25, issue.12, pp.1075-1080, 1977. ,
DOI : 10.1109/TMTT.1977.1129277
A generalized theory and new calibration procedures for network analyzer self-calibration, IEEE Transactions on Microwave Theory and Techniques, vol.39, issue.4, pp.724-731, 1991. ,
DOI : 10.1109/22.76439
Reducing the number of calibration standards for network analyzer calibration, IEEE Transactions on Instrumentation and Measurement, vol.40, issue.4, p.40, 1991. ,
DOI : 10.1109/19.85343
match-reflect: One result of a rigorous Theory for deembedding and network analyzer calibration, Proc. 18 th European Microwave Conference, pp.909-914, 1988. ,
The Six-Port Reflectometer: An Alternative Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, vol.25, issue.12, pp.1075-1080, 1977. ,
DOI : 10.1109/TMTT.1977.1129277
Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, vol.27, issue.12, pp.987-993, 1979. ,
DOI : 10.1109/TMTT.1979.1129778
Développement de filières technologiques dédiées à l'intégration de microsystèmes sur silicium, Thèse de doctorat, 2005. ,
« Two-port network analyzer calibration using an unknown thru» IEEE Microwave and Guided Wave Lett, pp.505-507, 1992. ,
on-silicon probing calibration methods» proceeding of the IEEE 1988 Bipolar circuits and technology meeting, pp.154-157, 1988. ,
Some accuracy in on wafer calibration » notes for workshop accuracy in on wafer measurement, IEEE MTT-S International Microwave Symposium, pp.38-49, 1994. ,
CAD models for shielded multilayered CPW, IEEE Transactions on Microwave Theory and Techniques, vol.43, issue.4, pp.772-779, 1980. ,
DOI : 10.1109/22.375223
Reflect-Line: An Improved Technique for Calibrating the Dual Six-port Automatic Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, vol.27, 1979. ,
110 GHz measurements in coax using the 1 mm connector, » Microwave J, vol.42, pp.22-34, 1999. ,
Calibration procedures with series impedances and unknown lines simplify on-wafer measurements, IEEE Transactions on Microwave Theory and Techniques, vol.47, issue.1, 1999. ,
DOI : 10.1109/22.740065
A self-calibration approach in competition to the LRM method for onwafer measurements, 45th ARFTG Conf. Proc., Orlando, FL, pp.129-136, 1995. ,
Robust algorithms for Txx network analyzer self-calibration procedures, IEEE Transactions on Instrumentation and Measurement, vol.43, issue.1, pp.18-23, 1994. ,
DOI : 10.1109/19.286348
« An automatic network analyzer system, » Microwave J, vol.11, pp.45-52, 1968. ,
The Realization of High-Frequency Impedance Standards Using Air-Spaced Coaxial Lines, IEEE Transactions on Instrumentation and Measurement, vol.13, issue.4, pp.265-272, 1964. ,
DOI : 10.1109/TIM.1964.4313413
« On-wafer calibration using space conservative (SOLT) standards, » 1999 IEEE MTT-S Int'l Microwave Symposium, 1999. ,
Novel micromachined approaches to MMICs using low-parasitic, high-performance transmission media and environments, 1996 IEEE MTT-S International Microwave Symposium Digest ,
DOI : 10.1109/MWSYM.1996.511232
Novel micromachined approaches to MMICs using low-parasitic, high-performance transmission media and environments, 1996 IEEE MTT-S International Microwave Symposium Digest ,
DOI : 10.1109/MWSYM.1996.511232
Weller « Design and Modelling of 4-bit Slow-Wave EMS Phase Shifters, IEEE MTT, vol.54, p.1, 2006. ,
Electronically Tunable Multi-Line TRL Using an Impedance Matched Multi-Bit MEMS Phase Shifter», IEEE MICROW AND WIRELESS COMPONENTS LETTERS, vol.15, issue.2, 2005. ,
MEMS phase shifters using cascaded slow-wave structures for improved impedance matching and/or phase shift, 2004 IEEE MTT-S International Microwave Symposium Digest (IEEE Cat. No.04CH37535), pp.725-728, 2004. ,
DOI : 10.1109/MWSYM.2004.1339061
Formulations of the Basic Vector Network Analyzer Error Model including Switch-Terms, 50th ARFTG Conference Digest, pp.115-126, 1997. ,
DOI : 10.1109/ARFTG.1997.327265
« Calibration Comparison Method for Vector Network Analyzers, » 48 th ARFTG Conf. Digest, pp.38-45, 1996. ,
A multiline method of network analyzer calibration, IEEE Transactions on Microwave Theory and Techniques, vol.39, issue.7, 1991. ,
DOI : 10.1109/22.85388
Band Space Conservative on Wafer Network Analyzer Calibrations with More Complex SOLT Definitions,» Master's Thesis, 2004. ,
Lluis Pradell « New Theoretical Analysis of the LRRM Calibration Technique for Vector Network Analyzers, IEEE Transactions on Instrumentation and Measurement, vol.50, issue.5, 2001. ,
E «Verification of LRRM Calibrations with Load Inductance Compensation for CPW Measurements on GaAs Substrates », Cascade Microthec, 1993. ,
Open- and short-circuit terminated series stubs in finite-width coplanar waveguide on silicon, IEEE Transactions on Microwave Theory and Techniques, vol.45, issue.6, pp.970-976, 1997. ,
DOI : 10.1109/22.588611
« Network Analyzer Error Models and Calibration Methods » ARFTG/NIST Short Course on RF Measurements for a Wireless World, 2001. ,
« On the Calibration Process of Automatic Network Analyzer Systems » Microwave Theory and Techniques, IEEE Transactions on, vol.22, issue.4, pp.457-458, 1974. ,
Influence of Nonideal Calibration Items on S-Parameter Uncertainties Applying the SOLR Calibration Method, IEEE Transactions on Instrumentation and Measurement, vol.58, issue.4, 2009. ,
DOI : 10.1109/TIM.2008.2006962
A simple evaluation procedure of the TAN calibration and the influence of non-ideal calibration elements on VNA S-parameter measurements, Advances in Radio Science, vol.5, pp.5-12, 2007. ,
DOI : 10.5194/ars-5-5-2007
Influence of Non-ideal LRL or TRL Calibration Elements on VNA S- Parameter Measurements » Advances in Radio Science (Kleinheubacher Berichte), pp.51-58, 2005. ,
«Uncertainty of VNA S-Parameter Measurement due to Non-Ideal TRL Calibration Items, IEEE Trans. Instrum. Meas, vol.55, pp.676-679, 2005. ,
Uncertainty of VNA S-Parameter Measurement due to Non-Ideal TMSO or LMSO Calibration Standards » Advances in Radio Science (Kleinheubacher Berichte), pp.1-8, 2003. ,
Influence of tmso calibration standards uncertainties on vna s -parameter measurements, IEEE Transactions on Instrumentation and Measurement, vol.52, issue.2, pp.311-315, 2003. ,
DOI : 10.1109/TIM.2003.810041
Manos Tentzeris, and John Papapolymerou « Modeling and Characterization of Thin Film Broadband Resistors on LCP for RF Applications » Electronic Components and Technology Conference, 2006. ,
Advanced technique for broadband onwafer RF device characterization, » in ARFTG Microwave Measurements Conference-Spring, pp.83-90, 2004. ,
Wattenberg « RF Measurements of Die and Packages » Artech House microwave library, 2002. ,
« RF Parameter Extraction of MMIC Nichrome Resistors, » Microwave and Optical Technology Letters, pp.409-412, 2003. ,
Experimental models of series and shunt elements in coplanar MMICs, 1992 IEEE Microwave Symposium Digest MTT-S, pp.1349-1352, 1992. ,
DOI : 10.1109/MWSYM.1992.188254
A general approach to network analyzer calibration, IEEE Transactions on Microwave Theory and Techniques, vol.40, issue.4, pp.754-759, 1992. ,
DOI : 10.1109/22.127526
« Parasitic Capacitance Effects of Planar Resistors», IEEE Transactions on Components, Hybrids, and Manufacturing Technology, vol.12, issue.3, pp.348-351, 1989. ,
Modeling of some coplanar waveguide discontinuities, IEEE Transactions on Microwave Theory and Techniques, vol.36, issue.12, pp.1796-1803, 1988. ,
DOI : 10.1109/22.17415
« A unifed mathematical approach to twoport calibration techniques and some applications, »IEEE Trans. Microwave Theory Tech, vol.37, issue.12, pp.1100-1115, 1977. ,
Extension of the application of conformal mapping techniques to coplanar lines with finite dimensions, International Journal of Electronics, vol.17, issue.1, pp.47-56, 1980. ,
DOI : 10.1080/00207218008901066
Uwe Arz, « An Optimal Vector Network Analyzer Calibration Algorithm, 2003. ,
« LRM probe-tip calibrations using non-ideal standards, » Microwave Theory and Techniques, IEEE Transactions on, vol.43, issue.2, pp.466-469, 1995. ,
Marks « User's Manual Program CAP Rev. 1.31», NIST Report, 1995. ,
Compensation for substrate permittivity in prob-tip calibration, pp.115-126, 1994. ,
Comparison of On-Wafer Calibrations, 38th ARFTG Conference Digest, pp.68-81, 1992. ,
DOI : 10.1109/ARFTG.1991.324040
Coplanar Waveguide: A Surface Strip Transmission Line Suitable for Nonreciprocal Gyromagnetic Device Applications, IEEE Transactions on Microwave Theory and Techniques, vol.17, issue.12, pp.1087-1090, 1969. ,
DOI : 10.1109/TMTT.1969.1127105
Linear estimation and related topics », A Survey of Numerical Analyze, pp.909-914, 1961. ,