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AMS/RF Design for Reliability Methodology: a Reliable RF Front-end Design

Abstract : In this work, we have been motivated to innovate in RF front-end design. New analysis and synthesis methodologies have been proposed including the variability and the ageing degradation in the center of the design trade-off. Moreover, the variability and the ageing degradation criteria have motivated us to propose changes in the classical design methodology with aim of a variability-aware and ageing-aware synthesis. Thus, the main objective of this work has been to improve the design of AMS/RF front-end circuits based on the investigation of a new trade-off imposed by transistor variability and ageing degradation. Aiming the proposition of both agents of characteristics variation as design criteria, we have designed a reliable RF front-end. Therefore, our major objective has been successfully achieved; while improving the design of AMS/RF front-end circuits based on the investigation of new trade-offs imposed by transistor variability and ageing. Finally, we could point some research perspectives in: new analysis tools, new design models, and new synthesis methods; linking variability and ageing.
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https://pastel.archives-ouvertes.fr/pastel-00628802
Contributor : Pietro Maris Ferreira <>
Submitted on : Tuesday, October 4, 2011 - 11:29:31 AM
Last modification on : Friday, July 31, 2020 - 10:44:05 AM
Long-term archiving on: : Thursday, March 30, 2017 - 4:14:21 PM

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  • HAL Id : pastel-00628802, version 1

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Pietro Maris Ferreira. AMS/RF Design for Reliability Methodology: a Reliable RF Front-end Design. Electronics. Télécom ParisTech, 2011. English. ⟨pastel-00628802⟩

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