Croissance de films de cuprates supraconducteurs par épitaxie par jets moléculaires

Abstract : The present study is devoted to growth by molecular beam epitaxy of BiSrCaCuO films. Tools and methods for real time monitoring of the growth by RHEED electron diffraction are described, including software for post-growth analysis of correlations between the evolution of the RHEED pattern and the physical properties (composition, structure and morphology, transport). This analysis, applied to the special case of "Bi poor" compounds, allows to describe them as an intergrowth nanostructure, partly ordered following a brick-wall scheme in which two different types of nanophases alternate : Bi-2212 and Bi-2PRQ with a double thickness. Depending on the overall composition of the film, three 2PRQ nanophase families are identified which correspond to specific structural compounds : stoechiometric Bi-2267, Sr rich Bi-2446 and Cu rich Bi-2429 based on ladder Cu2O3 layers. The physical conditions corresponding to the growth of each nanostructured family are described.
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Submitted on : Thursday, November 24, 2011 - 3:11:56 PM
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  • HAL Id : pastel-00644501, version 1

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Florin Beuran. Croissance de films de cuprates supraconducteurs par épitaxie par jets moléculaires. Agrégats Moléculaires et Atomiques [physics.atm-clus]. Université Pierre et Marie Curie - Paris VI, 2005. Français. ⟨pastel-00644501⟩

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