Développement de la microdiffraction Kossel pour l'analyse des déformations et contraintes à l'échelle du micromètre : applications à des matériaux cristallins

Abstract : X-ray diffraction is a non-destructive method frequently used in materials science to analyse the stress state at a macroscopic scale. Due to the growing complexity of new materials and their applications, it is necessary to know the strain and stress state at a lower scale. Thus, a Kossel microdiffraction experimental set-up was developed inside a scanning electron microscope. It allows to obtain the crystallographic orientation as well as the strains and stresses within a volume of a few cubic micrometers. Some experiments were also performed using a synchrotron radiation. An experimental procedure was developed to optimize the acquisition of Kossel line patterns and their post-processing. The stress calculation from Kossel patterns was validated by comparing the stress state of single crystals during in situ mechanical loading, obtained by Kossel microdiffraction and with classical diffraction methods. Then Kossel microdiffraction was applied to polycrystalline samples by gradually decreasing the grain size. Intergranular stress heterogeneities were for example measured in an interstitial-free steel. Experiments were finally carried out in thin layer samples representative of microelectronic components.
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Submitted on : Thursday, June 7, 2012 - 4:21:42 PM
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Denis Bouscaud. Développement de la microdiffraction Kossel pour l'analyse des déformations et contraintes à l'échelle du micromètre : applications à des matériaux cristallins. Science des matériaux [cond-mat.mtrl-sci]. Arts et Métiers ParisTech, 2012. Français. ⟨NNT : 2012ENAM0012⟩. ⟨pastel-00705441⟩

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