Reliability of analog-to-digital Sigma-Delta converters

Abstract : This thesis concentrates on reliability-aware methodology development, reliability analysis based on simulation as well as failure prediction of CMOS 65nm analog and mixed signal (AMS) ICs. Sigma-Delta modulators are concerned as the object of reliability study at system level. A hierarchical statistical approach for reliability is proposed to analysis the performance of Sigma-Delta modulators under ageing effects and process variations. Statistical methods are combined into this analysis flow.
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Hao Cai. Reliability of analog-to-digital Sigma-Delta converters. Electronics. Télécom ParisTech, 2013. English. ⟨NNT : 2013ENST0046⟩. ⟨tel-01307376⟩

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