H. .. , 102 Intrinsic hydrogenated amorphous silicon carbide (i)a-SiC, p.103

. , P-type hydrogenated amorphous silicon (p)a-Si:H and (p++)a-Si:H. .106 Indium tin oxide ITO

. , List of Figures 1.1 World energy consumption

. , Prices of utility-scale solar PV

.. .. Examples,

. , Single heterojunction solar cells built on a pyramidal textured wafer. 12 2.2 Laser scanning confocal microscopy images of studied pyramidal textures

, Radial junction solar cells built on silicon nanowire arrays, p.16

. .. , Crucial steps of the SiNW fabrication process, p.17

, Mueller matrix polarimeter installed on the PECVD reactor Plasfil

. .. , Angle-resolved Mueller matrix polarimetry set-up, p.23

. .. , Schematic representation of the thin film system, p.36

. , Total reflectance and transmittance of pyramidal textured samples. 55 5.2 Schematic drawing of the dominant path of light undergoing doublereflection from the pyramidal facets

. , Measured and modeled total reflectance of pyramidal textured samples

, Comparison of measured reflectance with results of various models, vol.58

. .. Si-pyramid, 59 5.6 SEM cross-sectional images of pyramidal surfaces of wafers textured by different etching conditions

. , Total reflectance of the pyramidal textured wafers as a function of the angle of incidence, p.61

. , Mueller matrix polarimetric data of pyramidal textured samples

. .. , 13 Schematic drawing of a multi-layer optical model consisting of a c-Si substrate covered by an a-Si:H layer, vol.66

H. , H layers on c-Si pyramidal wafer

. , Linear dependence of the thickness of a-Si:H passivation layer on the deposition time

. , 70 5.18 Illustration of the modeled front surface of the studied solar cell, TEM image and fit results of A1-11, p.71

, Cummulative absorptions in thin films on pyramids, p.73

. , J ph loss as a function of the ITO deposition time for various types of c-Si wafers

. , Light JV characteristics of SHJ solar cells fabricated on textured wafers

, Real and imaginary parts n and k of Corning glass refractive index, p.79

, Multi-layer optical model of ZnO:Al on Corning glass, p.79

, Real and imaginary parts n and k of ZnO:Al refractive index, p.81

, Multi-layer optical models for Sn on Corning glass, p.82

. , Fit results for Sn on Corning glass

, Real and imaginary parts n and k of Sn refractive index, p.83

. , Ellipsometric data of Sn on Coring glass measured during increasing the temperature in the reactor

. , 85 6.11 Comparison of real and imaginary parts n and k of Sn refractive index obtained from in-situ measurements and from bound multimodel, Ellipsometric data of Sn on Coring glass measured during H 2 plasma treatment in the reactor

. , Optical model of Sn droplets

. Fit-results-for-sn-droplets and . .. Sinws, , vol.87

, Mueller matrix elements M 33 and M 43 measured during SiNW growth, vol.88

. .. , Optical model of first stages of SiNW growth, p.90

. .. , Optical model of later stages of SiNW growth, p.90

.. .. , Best fit parameters for the L3 layer representing the mixture of Sn droplets and silicon

. , Best fit parameters for the L4 layer representing the shortest and densest nanowires in the matrix of a-Si:H

. , Best fit parameters for the L5 layer representing the medium length, less dense nanowires

. , Best fit parameters for the L6 layer representing the longest very sparse nanowires

. , Trends for the silicon deposition

, Fit results for SiNWs measured ex-situ after 8 min growth, p.96

. , Multi-layer optical models for SiNWs measured ex-situ after 8 min growth

A. , Multi-layer optical model for determination of the optical function of (i)a-Si:H

. , Fit results for (i)a-Si:H on Corning glass

. , Comparison of real and imaginary parts n and k of refractive index of silicon based materials

A. , Multi-layer optical models for determination of the optical function of (i)a-SiC:H

. , Comparison of real and imaginary parts n and k of refractive index of (i)a-SiC:H obtained from different models

. .. , A.6 Fit results for (i)a-SiC:H on Corning glass and wafer, p.107

A. , Multi-layer optical model for determination of the optical function of (p)a-Si

A. , Multi-layer optical model for determination of the optical function of (p++)a-Si

. , 108 A.10 Multi-layer optical models for determination of the optical function of ITO, A.9 Fit results for (p)a-Si:H and (p++)a-Si:H on Corning glass

A. , 11 Fit results and refractive index of ITO on Corning glass, p.109

A. ;. , 12 Fit results for ITO on pyramidal textured wafers, p.110

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