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A strategy for soft-error vulnerability estimation using the single-event transient susceptibilities of each gate

Abstract : The Soft-Error Vulnerability (SEV) is an estimated parameter that, in conjunction with the characteristics of the radiation environment, is used to obtain the Soft-Error Rate (SER), that is a metric used to predict how digital systems will behave in this environment. Currently, the most confident method for SER estimation is the radiation test, since it has the actual interaction of the radiation with the electronic device. However, this test is expensive and requires the real device, that becomes available late on the design cycle. These restrictions motivated the development of other SER and SEV estimation methods, including analytical, electrical and logic simulations, and emulation-based approaches. These techniques usually incorporate the logical, electrical and latching-window masking effects into the estimation process. Nevertheless, most of them do not take into account a factor that is intrinsic to the radiation test: the probability of the radiation particle to produce a Soft-Error (SE) at the output of the gates of the circuit, referred to as Single-Event Transient (SET) susceptibility. In this context, we propose a strategy for SEV estimation based on these SET susceptibilities, suitable for simulation- and emulation-based frameworks. In a simplified version of this strategy, the SET susceptibilities take into account only the effects of the gate topology, while in a complete version, these susceptibilities consider both the topology and the operation of the circuit, that affects its input pattern distribution. The proposed strategy was evaluated with a simulation-based framework, estimating the SEV of 38 benchmark circuits. The results show that both versions of the strategy lead to an improvement in the estimation accuracy, with the complete version presenting the lowest estimation error. Finally, we show the feasibility of adopting the proposed strategy with an emulation-based framework.
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  • HAL Id : tel-02484881, version 1

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Fábio Batagin Armelin. A strategy for soft-error vulnerability estimation using the single-event transient susceptibilities of each gate. Micro and nanotechnologies/Microelectronics. Université Paris-Saclay; Instituto tecnólogico de aeronáutica (São José dos Campos, Brésil), 2019. English. ⟨NNT : 2019SACLT035⟩. ⟨tel-02484881⟩

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